Mixed-Signal ASICs:
From design to good integrated circuits

Workshop on Affordable Design and Production of Mixed-Signal ASICs for Small and Medium Enterprises (SMEs)

 
15:15 - 16:00 Presentation [L. v. d.Logt]: "Model driven test development and simulation"
 
Abstract: While the IC design flow is fully supported by advanced tools and flows, the test development flow is hardly supported by any type of verification tooling. Getting a flawless industrial test plan executing on the tester platform can be a time consuming process. Although the designer's mixed signal simulations prove to be correct, measurements on tester hardware are required to get all timings and signals correct and may deviate from the simulations. Tedious debugging and lengthy test development cycles are the result of this discrepancy. In this presentation, we show a methodology and tool flow based on test simulation of the entire tester interface. The architecture definition will be explained including the hardware abstraction layers and instrumentation models. It will be demonstrated that test simulation can ease the process of industrializing a test plan.
 
Biography: Leon VAN DE LOGT has a MSc. degree in Applied Semiconductor physics from the University of Technology Eindhoven, The Netherlands. He has a long history in digital and analog test engineering for Mixed signal circuits, SoC and SIP designs. Leon worked in the Philips Research labs on test innovation for a variety of consumer and automotive products. In 2006 he joined NXP semiconductors where he was responsible for the improvement of analogue testing for volume production and he had a leading role in the test innovation program in NXP. Leon is holding more than 10 patents in the field of digital and analog testing. In 2009 he initiated the foundation of D4T Systems, a start-up with main focus on the automation and simulation of the complete tester-chip interface. Currently, he is director of the company.
 

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